Published By Federal Laboratory Consortium
Issued over 9 years ago
Summary
Description
FUNCTION: Characterizes the internal micro/nanostructures of metallic, magnetic, electronic, and other multifunctional and structural materials using a variety of electron microscopy techniques. INSTRUMENTATION: (1) JEOL 2010F transmission electron microscope (TEM): A 200 KeV field emission TEM for sub-nanometer-scale analysis of structure and composition. Capabilities include: atomic resolution TEM (ARTEM), electron energy loss spectroscopy (EELS), energy dispersive spectroscopy (EDS), and scanning transmission electron microscopy (STEM) with atomicresolution Z-contrast imaging, energy filtered imaging, electron holography, and spectrum imaging. (2) Phillips CM30 TEM: A 300 KeV operating voltage TEM especially utilized for conventional TEM studies of advanced naval steels requiring a large range of tilts for microstructural and defect analyses including conventional bright field and dark field imaging, weak beam dark field analysis, selected area diffraction, EDS, and elemental X-ray mapping using an electron beam/image displacement attachment. (3) Leo scanning electron microscope (SEM) with electron backscatter diffraction (EBSD) capability: SEM with a field emission gun (FEG) electron source. Capabilities include high-resolution SEM, EDS, and EBSD (TexSem Laboratory system) with automated orientation mapping and quantification.