Datasets / Spectroscopic Ellipsometer: Woollam M-2000

Spectroscopic Ellipsometer: Woollam M-2000

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Published By Federal Laboratory Consortium

Issued over 9 years ago

US
beta

Summary

Type of release
a one-off release of a set of related datasets

Data Licence
Not Applicable

Content Licence
Creative Commons CCZero

Verification
automatically awarded

Description

Description: This system is used to measure thin fils properties (thickness and refractive index) Scientific Opportunities / Applications: Thin film characterization Measures thickness, optical constants on single or multi-layer stacks

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