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FUNCTION: Characterizes the nanometer scale of biological, chemical, physical, electronic, and mechanical properties of surfaces and thin films using scanning probe microscopies/spectroscopies, and a variety of complementary surface analysis techniques. The limits of materials miniaturization are explored by using the new microscopes to fabricate and manipulate surface structures of nanometer size. This technology is used to investigate new chemical, biological, and magnetic sensors, electronic devices, and nanoscale materials. DESCRIPTION: Scanning tunneling microscopy/spectroscopy enables observation of the surface topography, chemical reactivity, and electronic structure of conductive substrates with atomic-scale resolution. The atomic force microscope (AFM) provides nanometer-scale resolution of surface topography, mechanical properties, and tip-surface interaction forces on both conductive and insulating substrates. The tip-surface interaction forces, including frictional forces, can be measured with nanonewton (single chemical bond) precision. An ultra-high-vacuum (UHV) system for nanomanipulation and nanoprobe characterization is also available in the Nanoscience Research Laboratory. INSTRUMENTATION: NRL-built UHV scanning tunneling microscope/spectroscope (STM/S) with facilities for low-energy electron diffraction (LEED) and Auger electron spectroscopy (AES); Omicron UHV variable temperature STM/AFM integrated with a second UHV system housing a multi-tip STM with a scanning electron microscope (5 nm resolution) and scanning Auger microprobe; Park Scientific Instruments AutoProbe UHV STM/AFM integrated with the NRL Molecular Beam Epitaxy (MBE) Epicenter for characterizing semiconductor surfaces following MBE, including cross-sectional STM; Nanoscope IIIa multimode AFM (lateral force, magnetic force, and tapping modes) equipped with breakout box and force-volume mapping system; TM Microscopes Autoprobe CP AFM used for dip pen nanolithography; Digital Instruments Bioscope AFM integrated with a Zeiss Axiovert 100 inverted optical microscope with fluorescence, micromanipulation, and microinjection capabilities; and Nanoscope IIIa and Multimode AFM, NRL-built lateralforce microscope, and Hysitron scanningnanoindenters (Triboscope and Bioindenter) with commercial and custom software to measure surface mechanical properties.