Datové sady / Atomic Force Microscope 1: Veeco Dimension 3100


Atomic Force Microscope 1: Veeco Dimension 3100

Vydavatel Federal Laboratory Consortium

Datum vydání před téměř 10 roky

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Shrnutí

Co poskytovatel nabízí?
a one-off release of a set of related datasets

Databázová licence
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Licence na obsah
Creative Commons CCZero

Způsob ověření
ověřený automaticky

Popis

Description: CORAL Name: AFM 1 A tool used to characterize the material surface, nanostructures generated by nanofabrication, nanomanipulation, and nanolithography. The tool can take samples up to 200mm in diameter and 12mm in thickness. Specifications / Capabilities: Contact mode, Tapping mode TM, Phase imaging TM Electrostatic force microscopy Magnetic force microscopy Nanomanipulation and nanolithography Scientific Opportunities / Applications: Surface characterization for thin films Pattern characterization for lithography structures, magnetic media, CD/DVDs Biomaterials, optics and other samples Nanomanipulation and nanolithography using AFM tip